EMI between system instrumentation is managed through standards for common  mode current and ground impedance

About

William J. Bowhers, Principal

 

Current Projects

· Automatic Test Equipment Instrumentation Standards (detail)

·  20ps FPGA (Xilinx Spartan 3) time measurement interpolator

· Highly isolated 60V / 2A V-I instrument

· Decentralized controllers in robotic applications

Recent Publications

“How MATLAB simplifies top-down design of closed-loop systems,” EDN, April 12, 2007.

“Power management device characteristics for semiconductor test instrumentation,” APEC 2007, (detail).

 

Patents

6,675,117        Calibrating Single-Ended Channels for Differential Performance

6,133,725        Compensation for the Effects of Round-Trip Delay in Automatic Test Equipment

4,792,932        Time Measurement in Automatic Test Equipment

Curriculum vitæ                                                         

Instrumentation Development Projects    

· 100dB SNR Audio source / measure

· Pico-second time measurement

· 750V / 10A mains-level source / measure

· 30V / 100A automotive source / measure

· High-speed digital printed circuit boards

                                                                     

Test and Measurement System Architecture

· Teradyne system developments

· Low-noise grounding architecture

 

Electrical Engineering Instructor